Characterization of cellophane birefringence due to uniaxial strain by focused surface plasmon microscopy

Anisotropic Alteration of Scleral Birefringence to Uniaxial Mechanical Strain

PURPOSE To investigate the relationship between scleral mechanical properties, its birefringence, and the anisotropy of birefringence alteration in respect of the direction of the strain by using PS-OCT. METHODS The scleral birefringence of thirty-nine porcine eyes was measured with a prototype PS-OCT. A rectangle strip of sclera with a width of 4 mm was dissected at the temporal region 5 mm ...

Transmission surface plasmon resonance microscopy

Surface plasmon interference excited by tightly focused laser beams.

We show that interfering surface plasmon polaritons can be excited with a focused laser beam at normal incidence to a plane metal film. No protrusions or holes are needed in this excitation scheme. Depending on the axial position of the focus, the intensity distribution on the metal surface is either dominated by interferences between counterpropagating plasmons or by a two-lobe pattern charact...

Real-time observation of birefringence by laser scanning surface plasmon microscope

Recently we developed a laser scanning surface plasmon microscope and demonstrated the developed system can realize highly spatial resolution without lack of high sensitivity to thickness and refractive-index distributions[1]. In this paper, we applied this technique to observe the orientation of the anisotropic materials such as liquid crystal, poled dye molecules, and so on. Figure 1 (a) show...

Imaging of terahertz surface plasmon waves excited on a gold surface by a focused beam.

Surface plasmon polariton (SPP) waves formed near a tightly focused THz beam on a metallic surface are detected by an integrated sub-wavelength aperture THz near-field probe. The probe allows mapping the electric field pattern of the SPP wave and tracking the SPP propagation from the center of the focal spot. The SPP nature of the observed wave is confirmed by time-resolved measurements. Analys...